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Mechanism of resistive switching in HfOx-based memristors
We conducted an in-depth study of the resistance-switching mechanism in classical HfOx-based devices. Through atomic-level characterisation of the dynamic evolution of conductive filaments, we confirmed that the filament system in this type of device has a quasi-core-shell structure, consisting of a metallic Hf6O core and an insulating HfO2 crystalline shell. constitute. The study pinpointed multiple […]
